Misfit strain relaxation by stacking fault generation in InGaN quantum wells grown on m-plane GaN

• Alec M. Fischer

• Zhihao Wu

• Kewei Sun

Bibliographic Information

Other Title

• Misfit strain relaxation by stacking fault generation in InGaN quantum wells grown on m plane GaN

Journal

• Applied physics express : APEX

  Applied physics express : APEX 2 (4), 2009-04

  Tokyo : Japan Society of Applied Physics

Details

• CRID: 1523951030148959872
• NII Article ID: 10025085540
• NII Book ID: AA12295133
• ISSN: 18820778
• NDL BIB ID: 10210743
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I10210743
• Text Lang: en
• NDL Source Classification:
  • ZM35(科学技術--物理学)
• Data Source:
  • NDL
  • CiNii Articles