A DFT-based method of feature extraction for palmprint recognition (特集 平成20年電気学会電子・情報・システム部門大会) A DFT-Based Method of Feature Extraction for Palmprint Recognition

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Abstract

Over the last quarter century, research in biometric systems has developed at a breathtaking pace and what started with the focus on the fingerprint has now expanded to include face, voice, iris, and behavioral characteristics such as gait. Palmprint is one of the most recent additions, and is currently the subject of great research interest due to its inherent uniqueness, stability, user-friendliness and ease of acquisition. This paper describes an effective and procedurally simple method of palmprint feature extraction specifically for palmprint recognition, although verification experiments are also conducted. This method takes advantage of the correspondences that exist between prominent palmprint features or objects in the spatial domain with those in the frequency or Fourier domain. Multi-dimensional feature vectors are formed by extracting a GA-optimized set of points from the 2-D Fourier spectrum of the palmprint images. The feature vectors are then used for palmprint recognition, before and after dimensionality reduction via the Karhunen-Loeve Transform (KLT). Experiments performed using palmprint images from the ‘PolyU Palmprint Database’ indicate that using a compact set of DFT coefficients, combined with KLT and data preprocessing, produces a recognition accuracy of more than 98% and can provide a fast and effective technique for personal identification.

Journal

  • IEEJ Transactions on Electronics, Information and Systems

    IEEJ Transactions on Electronics, Information and Systems 129(7), 1296-1304, 2009-07-01

    The Institute of Electrical Engineers of Japan

References:  30

Cited by:  1

Codes

  • NII Article ID (NAID)
    10025101248
  • NII NACSIS-CAT ID (NCID)
    AN10065950
  • Text Lang
    ENG
  • Article Type
    Journal Article
  • ISSN
    03854221
  • NDL Article ID
    10357320
  • NDL Source Classification
    ZN31(科学技術--電気工学・電気機械工業)
  • NDL Call No.
    Z16-795
  • Data Source
    CJP  CJPref  NDL  J-STAGE 
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