パルス光加熱サーモリフレクタンス法による薄膜熱物性計測技術 : 実用薄膜の測定と解析  [in Japanese] THERMOPHYSICAL PROPERTIES MEASUREMENTS OF THIN FILMS BY LIGHT PULSE HEATING THERMOREFLECTANCE METHODS : Measurements and Analysis of Thin Films for Industrial Use  [in Japanese]

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Author(s)

Journal

  • Thermophysical properties

    Thermophysical properties 30, 241-243, 2009-10-27

References:  9

Cited by:  1

Codes

  • NII Article ID (NAID)
    10025413149
  • NII NACSIS-CAT ID (NCID)
    AN10370091
  • Text Lang
    JPN
  • Article Type
    Proceedings
  • ISSN
    09111743
  • Data Source
    CJP  CJPref 
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