Growth of Semipolar InN on r-plane (10-12) Sapphire by RF-MBE

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  • RF-MBE法によるr面(10-12)Sapphire基板上半極性面InNの結晶成長
  • RF MBEホウ ニ ヨル rメン 10 12 Sapphire キバン ジョウ ハンキョクセイメン InN ノ ケッショウ セイチョウ

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Abstract

In this study, we report the growth of semipolar InN films on r-plane (10-12) substrates by radio-frequency plasma-assisted molecular beam epitaxy (RF-MBE). Semipolar InN films were successfully obtained by controlling the substrate nitridation temperature between 400°C and 600°C. We characterized the epitaxial relationship between r-plane sapphire and the obtained semipolar films using X-ray diffraction (XRD). It is found that c-axis of semipolar InN was declined by 21°from the direction perpendicular to r-plane sapphire surface along a-axis of InN.

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