Fundamental study on the estimation of weight of tuberous root of sweet potato with spectral reflectance

• ISHIKAWA Daitaro

  The United Graduate School of Agricultural Sciences Kagoshima University, 1-21-24, Korimoto, Kagoshima, 890-0065, Japan

• ISHIGURO Etsuji

  Faculty of Agriculture, Kagoshima University, 1-21-24 Korimoto, Kagoshima, 890-0065, Japan

• SEKIOKA Shin-ichi

  Faculty of Agriculture, Kagoshima University, 1-21-24 Korimoto, Kagoshima, 890-0065, Japan

• OGAMI Shuichiro

  Faculty of Agriculture, Kagoshima University, 1-21-24 Korimoto, Kagoshima, 890-0065, Japan

• HAKOYAMA Susumu

  Faculty of Agriculture, Kagoshima University, 1-21-24 Korimoto, Kagoshima, 890-0065, Japan

• KAWAMITSU Yoshinobu

  Faculty of Agriculture, Ryukyu University, 1 Senbara Nishihara, Okinawa, 903-0213, Japan

Bibliographic Information

Other Title

• 分光反射特性によるサツマイモの塊根部重量推定に関する基礎研究
• ブンコウ ハンシャ トクセイ ニ ヨル サツマイモ ノ カイコンブ ジュウリョウ スイテイ ニ カンスル キソ ケンキュウ

Abstract

Remote sensing has been studied for evaluation and/or estimation of growth and yields of many types of crops. Most of these were reported on the crops with leaves distribution vertically. On the other hand, for the crops with leaves of horizontal distribution, few remote sensing studies have been reported. Especially, for sweet potato (Ipomoea batatas Lam. cv. kogane-sengan), development of the monitoring technique during cultivating period has been expected.<br>This study was conducted to clarify the relationships between a tuberous root fresh weight per plant and leaf area, experimentally. The spectral characteristics from the leaves of sweet potato were measured by a handheld spectroradiometer during cultivating period. And the relationships among the tuberous root fresh weight, leaf area (LA) and the spectral characteristics were analyzed.<br>The growth estimation index (ND_{710, 510}) was defined as following formula used spectral reflectance of 710 nm and 510 nm; ND_{710, 510}=(R₇₁₀-R₅₁₀)/(R₇₁₀+R₅₁₀). It was confirmed that there was a negative correlation between LA and the growth index with negative correlation coefficient. It is thought that this originates in the change of the spectral reflectance immediately after planting. Moreover nitrogen content in leaves per plant in growing period was estimated NDVI, RVI and leaf contents indices shown by the following expressions; ND_{770, 660}=(R₇₇₀-R₆₆₀)/(R₇₇₀+R₆₆₀), ND_{530, 510}=(R₅₃₀-R₅₁₀)/(R₅₃₀+R₅₁₀).<br>These results showed the possibility of estimating the mass tuberous root during growth with non-destructive technique using spectral reflectance of sweet potato leaves.

Journal

• Journal of Agricultural Meteorology

  Journal of Agricultural Meteorology 65 (2), 191-200, 2009

  The Society of Agricultural Meteorology of Japan

Keywords

• Characteristics wave
• Growth estimation index
• Leaf nitrogen content estimation index
• Spectral reflectance
• Weight of tuberous root

Details

• CRID: 1390282679644709632
• NII Article ID: 10025614340
• NII Book ID: AA11530034
• DOI: 10.2480/agrmet.65.2.8
• ISSN: 18810136
• ISSN: 00218588
• NDL BIB ID: 10367011
• Web Site: https://agriknowledge.affrc.go.jp/RN/2030780232
• Web Site: http://id.ndl.go.jp/bib/10367011
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I10367011
• Web Site: http://www.jstage.jst.go.jp/article/agrmet/65/2/65_65.2.8/_pdf
• Text Lang: ja
• Data Source:
  • JaLC
  • IRDB
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed