Large-area electron beam irradiation for surface polishing of cast titanium

• NAKAMURA Takashi

  Department of Fixed Prosthodontics, Osaka University Graduate School of Dentistry

• NAKANO Yoshiro

  Department of Fixed Prosthodontics, Osaka University Graduate School of Dentistry

• USAMI Hirofumi

  Department of Fixed Prosthodontics, Osaka University Graduate School of Dentistry

• WAKABAYASHI Kazumichi

  Department of Fixed Prosthodontics, Osaka University Graduate School of Dentistry

• OHNISHI Hiroshi

  Nikkato Corporation

• SEKINO Tohru

  Institute of Scientific and Industrial Research, Osaka University

• YATANI Hirofumi

  Department of Fixed Prosthodontics, Osaka University Graduate School of Dentistry

書誌事項

タイトル別名

• Translucency and low-temperature degradation of silica-doped zirconia: A pilot study

抄録

The purpose of this study was to examine the translucency and low-temperature degradation of silica-doped experimental Y-TZP (Yttria-stabilized tetragonal zirconia polycrystal) containing almost no alumina. The experimental Y-TZP samples were sintered at either 1,450 or 1,500°C. The samples of commercially available translucent Y-TZP and conventional Y-TZP were used as controls. The contrast ratio (CR) and translucency parameter (TP) were obtained to compare the translucencies. In addition, the specimens were also subjected to an accelerated aging test. The results showed that the experimental Y-TZP sintered at 1,500°C and translucent Y-TZP exhibited almost the same level of translucency. During the accelerated aging test, the translucent Y-TZP underwent a substantial increase in monoclinic content, an index of degradation after the aging test. However, neither the experimental Y-TZP nor the conventional Y-TZP exhibited any appreciable change. It was concluded that the silica-doped Y-TZP will develop translucency and resistance to degradation when sintered at 1,500°C.

収録刊行物

• Dental Materials Journal

  Dental Materials Journal 35 (4), 571-577, 2016

  日本歯科理工学会

キーワード

• Zirconia
• Silica
• Translucency
• Low-temperature degradation

詳細情報

• CRID: 1390001204717256064
• NII論文ID: 10025916604
• NII書誌ID: AA10443149
• DOI: 10.4012/dmj.2015-274
• DOI: 10.4012/dmj.28.571
• COI: 1:STN:280:DC%2BD1Mnos1Sktw%3D%3D
• ISSN: 18811361
• ISSN: 02874547
• PubMed: 27477222
• Web Site: https://www.jstage.jst.go.jp/article/dmj/28/5/28_5_571/_pdf
• Web Site: https://www.jstage.jst.go.jp/article/dmj/35/4/35_2015-274/_pdf
• Web Site: https://search.jamas.or.jp/link/ui/2010070729
• 本文言語コード: en
• データソース種別:
  • JaLC
  • Crossref
  • PubMed
  • CiNii Articles
  • KAKEN
• 抄録ライセンスフラグ: 使用不可