Effect of surface stress around the S[A] step of Si(001) on the dimer structure determined by noncontact atomic force microscopy at 5K

• Yoshitaka Naitoh

• Yan Jun Li

• Hikaru Nomura

書誌事項

タイトル別名

• Effect of surface stress around the S A step of Si 001 on the dimer structure determined by noncontact atomic force microscopy at 5K

収録刊行物

• Journal of the Physical Society of Japan

  Journal of the Physical Society of Japan 79 (1), 2010-01

  Tokyo : Physical Society of Japan

キーワード

• atomic force microscopy
• silicon
• surface stress
• surface strain

詳細情報

• CRID: 1522543655450243200
• NII論文ID: 10025964050
• NII書誌ID: AA00704814
• ISSN: 00319015
• NDL書誌ID: 10513812
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I10513812
• 本文言語コード: en
• NDL 雑誌分類:
  • ZM35(科学技術--物理学)
• データソース種別:
  • NDL
  • CiNii Articles