放射光励起走査トンネル顕微鏡による高分解能元素分析イメージング  [in Japanese] Scanning Tunneling Microscopy Assisted by Synchrotron Radiation Light for High-resolution Element Specific Imaging  [in Japanese]

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Author(s)

Abstract

Microscope having atomic resolution with chemical sensitivity is one of the ultimate microscopes for the material science. Scanning tunneling microscope (STM) assisted by the core-level excitation by synchrotron radiation (SR) may be a possible candidate of such an ultimate microscope. In this paper we will demonstrate that we can observe element specific images of surfaces in the spatial resolution of several tens of nanometer by measuring the photon induced current images taken with an STM tip detecting the secondary electrons produced by the electron-hole recombination after the core-level excitation. Importance of the chemical contrast-enhancement by dividing the SR-STM image taken at photon absorption edge top by that of at the edge bottom is demonstrated by the observation of transition metal micro patterns. Possibility of a nanometer scale chemical imaging such as C<sub>60</sub> domain structure on Si(111)√3×√3-Ag surface with an assistance of high-brilliant light sources is also suggested.

Journal

  • Hyomen Kagaku

    Hyomen Kagaku 31(9), 452-458, 2010-09-10

    The Surface Science Society of Japan

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Codes

  • NII Article ID (NAID)
    10026633445
  • NII NACSIS-CAT ID (NCID)
    AN00334149
  • Text Lang
    JPN
  • Article Type
    ART
  • ISSN
    03885321
  • NDL Article ID
    10834025
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z15-379
  • Data Source
    CJP  NDL  J-STAGE 
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