Raman Spectroscopic Stress Evaluation of Femtosecond-Laser-Modified Region Inside 4H-SiC

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Author(s)

Journal

  • Applied physics express

    Applied physics express 3(1), "016603-1"-"016603-3", 2010-01-25

    IOP Publishing

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Codes

  • NII Article ID (NAID)
    10027013184
  • NII NACSIS-CAT ID (NCID)
    AA12295133
  • Text Lang
    ENG
  • Article Type
    SHO
  • ISSN
    18820778
  • NDL Article ID
    10522390
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z78-A526
  • Data Source
    CJP  NDL  Crossref 
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