Failure analysis of open faults by using detecting/un-detecting information on tests

Author(s)

Journal

  • Proc. Asian Test Symp., 2004

    Proc. Asian Test Symp., 2004, 222-227, 2004

Cited by:  1

Codes

  • NII Article ID (NAID)
    10027436767
  • Article Type
    Proceedings
  • Data Source
    CJPref 
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