Fault effect of open faults caused by adjacent signal lines in a 90nm IC

Journal

  • Proc. Int. Conf. on VLSI Design, 2009

    Proc. Int. Conf. on VLSI Design, 2009, 91-96, 2009

Cited by:  1

Codes

  • NII Article ID (NAID)
    10027436775
  • Article Type
    Proceedings
  • Data Source
    CJPref 
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