New trends in LEEM/PEEM for surface science study

• KOSHIKAWA Takanori

  Fundamental Electronics Research Institute, Osaka Electro-Communication University

Bibliographic Information

Other Title

• LEEM/PEEM を用いた表面研究の最前線
• LEEM PEEM オ モチイタ ヒョウメン ケンキュウ ノ サイゼンセン

Abstract

Low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) are now widely used methods of surface electron microcopy, which enable dynamic and versatile observation. They are attractive methods because they make it possible to obtain new information that cannot be obtained by conventional electron microscopy. In this paper, new developments are reported, including aberration correction, high-speed observation with picosecond order, magnetic domain observation with a laser technique and a new highly spin-polarized and bright spin electron gun.

Journal

• Oyo Buturi

  Oyo Buturi 79 (12), 1108-1115, 2010-12-10

  The Japan Society of Applied Physics

Keywords

• LEEM
• PEEM
• XPEEM
• SPELEEM
• SPLEEM
• emission microscopy

Details

• CRID: 1390282752337369088
• NII Article ID: 10027443350
• NII Book ID: AN00026679
• DOI: 10.11470/oubutsu.79.12_1108
• ISSN: 21882290
• ISSN: 03698009
• NDL BIB ID: 10927213
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I10927213
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed