EELS and Ab-Initio Study of Faceted CSL Boundary in Silicon

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Author(s)

    • TAKAHASHI Heishichiro
    • Laboratory of Integrated Function Materials, Center for Advanced Research of Energy Conversion Materials, Faculty of Engineering, Hokkaido University

Journal

  • Materials Transactions

    Materials Transactions 52(3), 276-279, 2011-03-01

    Japan Institute of Metals

References:  25

Codes

  • NII Article ID (NAID)
    10027837996
  • NII NACSIS-CAT ID (NCID)
    AA1151294X
  • Text Lang
    ENG
  • Article Type
    REV
  • ISSN
    13459678
  • NDL Article ID
    10990120
  • NDL Source Classification
    ZP41(科学技術--金属工学・鉱山工学)
  • NDL Call No.
    Z53-J286
  • Data Source
    CJP  NDL 
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