Effects of drain bias on threshold voltage fluctuation and its impact on circuit characteristics

• MIYAMURA M.

収録刊行物

• IEDM, December, 2008

  IEDM, December, 2008 447-450, 2008

詳細情報

• CRID: 1571698601169674496
• NII論文ID: 10027931499
• データソース種別:
  • CiNii Articles