X線共鳴発光分光法による高圧下での4f電子系化合物の物性研究  [in Japanese] Pressure dependence of the electronic structure of 4f electron materials as disclosed by resonant x-ray emission spectroscopy  [in Japanese]

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Journal

  • 放射光

    放射光 24(2), 53-64, 2011-03-31

    日本放射光学会

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Codes

  • NII Article ID (NAID)
    10028149547
  • NII NACSIS-CAT ID (NCID)
    AN10075706
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    09149287
  • NDL Article ID
    11089162
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z15-561
  • Data Source
    CJP  NDL 
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