A statistically harmonized alignment-classification in image space enables accurate and robust alignment of noisy images in single particle analysis

• KAWATA Masaaki

  Grid Technology Research Center, National Institute of Advanced Industrial Science and Technology (AIST)

• SATO Chikara

  Neuroscience Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)

Journal

• Journal of electron microscopy

  Journal of electron microscopy 56 (3), 83-92, 2007-06-01

Keywords

• multireference alignment
• two-dimensional averaging
• electron microscopy
• three-dimensional reconstruction
• image classification
• parallel processing

Details

• CRID: 1571980075761791232
• NII Article ID: 10028200131
• NII Book ID: AA00697060
• ISSN: 00220744
• Text Lang: en
• Data Source:
  • CiNii Articles