Aberration-Corrected Electron Microscopy for Nanocarbon Materials

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  • SATO Yuta
    Nanotube Research Center, National Institute of Advanced Industrial Science and Technology
  • SUENAGA Kazutomo
    Nanotube Research Center, National Institute of Advanced Industrial Science and Technology

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  • 収差補正電子顕微鏡によるナノカーボン物質の構造評価
  • シュウサ ホセイ デンシ ケンビキョウ ニ ヨル ナノカーボン ブッシツ ノ コウゾウ ヒョウカ

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Abstract

  Recent development of spherical aberration correctors for transmission electron microscopes (TEM) and scanning TEM (STEM) has enabled atomic-resolution imaging of nanocarbon materials even at relatively low electron acceleration voltages around and below 100 kV. In this article, we review some recent studies on carbon nanotubes (CNTs) and fullerene nanopeapods using aberration-corrected TEM/STEM. Local structure of each individual CNT can be visualized in details including point defects such as atomic vacancies and adatoms in aberration-corrected TEM images. Atomic-level structures of fullerene molecules and their orientation inside a CNT can be unambiguously observed. Identification of single metal atoms such as calcium and lanthanides in nanopeapods by using STEM-EELS operated at 60 kV is also presented.<br>

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