Investigation of the Low Resistivity Cu Wire Formation in the 8 Inch Wafer Using Ultra-High Purity Plating Materials
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- Tashiro Suguru
- Department of Material Science and Engineering, Faculty of Engineering, Ibaraki University
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- Kadota Hiroyuki
- Device Systems Center, Hitachi Kyowa Engineering Co., Ltd.
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- Ito Masahiko
- Department of Material Science and Engineering, Faculty of Engineering, Ibaraki University
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- Uchikoshi Masahito
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- Mimura Kouji
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- Issiki Minoru
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- Onuki Jin
- Department of Material Science and Engineering, Faculty of Engineering, Ibaraki University
Bibliographic Information
- Other Title
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- 高純度めっき材料を用いた低抵抗率Cu配線形成プロセスの8インチウエハによる検証
- コウジュンドメッキ ザイリョウ オ モチイタ テイテイコウリツ Cu ハイセン ケイセイ プロセス ノ 8 インチウエハ ニ ヨル ケンショウ
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Abstract
We have confirmed the effectiveness of ultra-high purity plating material on the formation of low resistivity Cu wires for 22 nm level ULSIs using 8 inch wafer. The resistivity of the 30 nm wide Cu wires formed by ultra-high purity process is found to be 30% lower than those for Cu wires fabricated by the conventional process. It was also found that the grain size of the ultra- high purity processed Cu wires is larger than that of the conventional processed Cu wires by 30%, and the grain size is much more uniform. This innovative new process is expected to be one of the powerful candidates as the Cu wire forming process for 22 nm level ULSIs.<br>
Journal
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- Journal of the Japan Institute of Metals and Materials
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Journal of the Japan Institute of Metals and Materials 75 (7), 386-391, 2011
The Japan Institute of Metals and Materials
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Details 詳細情報について
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- CRID
- 1390282681457789440
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- NII Article ID
- 10029368773
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- NII Book ID
- AN00187860
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- ISSN
- 18806880
- 24337501
- 00214876
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- NDL BIB ID
- 11171491
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed