X-ray Diffraction Limit Workshop Series Workshop 1-Diffraction Microscopy, Holography and Ptychography using Coherent Beams 報告  [in Japanese] Report on X-ray Diffraction Limit Workshop Series-Workshop 1 "Diffraction Microscopy, Holography and Ptychography using Coherent Beams"  [in Japanese]

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Author(s)

Journal

  • 放射光

    放射光 24(5), 273-274, 2011-09-30

Codes

  • NII Article ID (NAID)
    10029463208
  • NII NACSIS-CAT ID (NCID)
    AN10075706
  • Text Lang
    JPN
  • Article Type
    OTR
  • ISSN
    09149287
  • Data Source
    CJP 
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