Application and Development of Electron Microscopy for the Study of Stress Effects in Crop Plants

• MIYAKE Hiroshi

  Graduate School of Bioagricultural Sciences, Nagoya University

Bibliographic Information

Other Title

• 作物ストレス研究における電子顕微鏡技術の応用と展開

Journal

• 日本作物學會紀事

  日本作物學會紀事 78 428-433, 2009-03-27

Details

• CRID: 1570291225821928448
• NII Article ID: 10030133361
• NII Book ID: AN00189888
• ISSN: 00111848
• Text Lang: ja
• Data Source:
  • CiNii Articles