Device simulation of charge collection and single-event upset
Journal
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- IEEE Trans. Nucl. Sci.
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IEEE Trans. Nucl. Sci. 43 561-575, 1996
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Details 詳細情報について
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- CRID
- 1573105975588673280
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- NII Article ID
- 10030137613
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- Data Source
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- CiNii Articles