Sub-Nanometer Length Measurement System Using a fs-comb
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- KAJIMA Mariko
- AIST, NMIJ, Tsukuba Central3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563
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- MINOSHIMA Kaoru
- AIST, NMIJ, Tsukuba Central3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563
Bibliographic Information
- Other Title
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- 光コムを利用したサブナノメートル測長技術の開発
- ヒカリ コム オ リヨウ シタ サブナノメートルソクチョウ ギジュツ ノ カイハツ
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Abstract
A length measurement system with sub-nanometer accuracy was developed. The system used the optical
Journal
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- The Review of Laser Engineering
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The Review of Laser Engineering 39 (11), 842-846, 2011
The Laser Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390001204650350720
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- NII Article ID
- 10030151735
- 10031005940
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- NII Book ID
- AN00255326
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- ISSN
- 13496603
- 03870200
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- NDL BIB ID
- 023338801
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed