Simultaneous Scanning Force/Tunneling Microscopy Using a Quartz Cantilever with a Tungsten Tip

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Simultaneous scanning force/tunneling microscopy measurements are carried out on the Si(111)-(7\times 7) surface using quartz cantilevers. The retrace scanning mode enables constant height imaging even under heavy drift conditions at room temperature. Relatively clean tungsten tips produce huge time-averaged tunneling currents (\langle I_{\text{t}}\rangle) in the chemical bonding regime. In contrast, when the tip is contaminated with Si atoms due to tip--surface contacts, \langle I_{\text{t}}\rangle is suppressed or is barely detectable, while the force offers even better atomic contrast. This can explain the variety of magnitudes of \langle I_{\text{t}}\rangle obtained previously by some groups. The conversion formula between \langle I_{\text{t}}\rangle and instantaneous tunneling current is also verified, which is required for comparison of results with different cantilever oscillation amplitudes.

収録刊行物

  • Applied physics express

    Applied physics express 4(11), 115201-115201-3, 2011-11-25

    The Japan Society of Applied Physics

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各種コード

  • NII論文ID(NAID)
    10030153803
  • NII書誌ID(NCID)
    AA12295133
  • 本文言語コード
    EN
  • 資料種別
    SHO
  • ISSN
    18820778
  • NDL 記事登録ID
    023321410
  • NDL 請求記号
    Z78-A526
  • データ提供元
    CJP書誌  NDL  JSAP 
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