Contact Conditions in Connectors that Cause Common Mode Radiation
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- HAYASHI Yu-ichi
- Graduate School of Information Sciences, Tohoku University
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- KAYANO Yoshiki
- Department of Electrical and Electronic Engineering, Akita University
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- MIZUKI Takaaki
- Cyberscience Center, Tohoku University
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- SONE Hideaki
- Cyberscience Center, Tohoku University
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- INOUE Hiroshi
- Akita University
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When contact failure occurs in a connector in a coaxial high-frequency (HF) signal transmission line, it is well known that common-mode (CM) radiation occurs on the line. We focus on contact conditions in a connector causing such CM radiation. Experiments and simulations verify that CM radiation increases as the contact resistance increases. While the CM current strongly depends on the distribution pattern of contact resistances at a low resistance, the CM current does not depend on these pattern at a high resistance. Our results indicate that it is important to maintain a symmetrical distribution of contact spots whenever the number of such spots is four or more.
収録刊行物
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- IEICE Transactions on Electronics
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IEICE Transactions on Electronics E94-C (9), 1369-1374, 2011
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390282679353558016
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- NII論文ID
- 10030189376
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- NII書誌ID
- AA10826283
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- BIBCODE
- 2011IEITE..94.1369H
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- ISSN
- 17451353
- 09168524
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
- KAKEN
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- 使用不可