Parity-based fault detection architecture of S-box for advanced encryption standard

• KERMANI M. M.

Journal

• Proc. 21st IEEE Int. Symp. De-fect and Fault-Tolerance in VLSI Systems (DFT'06), Dec.

  Proc. 21st IEEE Int. Symp. De-fect and Fault-Tolerance in VLSI Systems (DFT'06), Dec. 572-580, 2006

Details

• CRID: 1570009750827368576
• NII Article ID: 10030191183
• Data Source:
  • CiNii Articles