Obstacle-avoiding electromigration aware wire planning for analog circuits

• LIN C. C.

Journal

• Proc. IEEE International Symposium Integrated Circuits, 2009

  Proc. IEEE International Symposium Integrated Circuits, 2009 651-654, 2009

Details

• CRID: 1573950400501487488
• NII Article ID: 10030192133
• Data Source:
  • CiNii Articles