放射光励起走査トンネル顕微鏡による高分解能元素分析  [in Japanese] High-Resolution Element specific Analysis with Scanning Tunneling Microscope Assisted by Synchrotron Radiation Light  [in Japanese]

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Abstract

<p>原子分解能を持ち,しかも化学組成を分析できる顕微鏡は究極の顕微鏡の一つといえる.エネルギー可変のシンクロトロン放射光(SR)による内殻励起を利用した走査トンネル顕微鏡(STM)は,そのような究極の顕微鏡の有力な候補となる可能性を秘めている.我々は,放射光により励起された内殻正孔が電子正孔対消滅を起こす際に生成される二次電子をSTM探針により検出し,その二次元分布を画像化することで,20 nm以下の高分解能で表面の化学組成分析に成功している.現在,信号検出感度を向上させつつ,最先端の光源に対応すべくシステムの改良を進めている.本稿ではこれら改良点を紹介すると共に,今後の展望についても述べる.</p>

<p>Microscope having atomic resolution with chemical sensitivity is one of the ultimate microscopes for the material science. Scanning tunneling microscope (STM) assisted by the core-level excitation using synchrotron radiation (SR) may be a possible candidate of such an ultimate microscope. We have demonstrated that we can observe element specific images of surfaces in the spatial resolution of several tens of nanometer by detecting the secondary electrons produced by the electron-hole recombination after the core-level excitation with an STM tip and taking the photon-induced current images. Recently, we have modified the system in order not only to improve its performance but also to accommodate a focused beam of a newly renovated beamline. Here, we briefly report on the modification and future prospects of this method.</p>

Journal

  • KENBIKYO

    KENBIKYO 47(1), 14-17, 2012-03-30

    The Japanese Society of Microscopy

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Codes

  • NII Article ID (NAID)
    10030552165
  • NII NACSIS-CAT ID (NCID)
    AA11917781
  • Text Lang
    JPN
  • Article Type
    REV
  • ISSN
    13490958
  • NDL Article ID
    023682555
  • NDL Call No.
    Z16-896
  • Data Source
    CJP  NDL  J-STAGE 
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