High-Resolution Element Specific Analysis with Scanning Tunneling Microscope Assisted by Synchrotron Radiation Light

• Eguchi Toyoaki

  科学技術振興機構ERATO中嶋ナノクラスター集積制御プロジェクト 慶應義塾大学大学院理工学研究科

• Okuda Taichi

  広島大学放射光科学研究センター

• Kinoshita Toyohiko

  高輝度光科学研究センター（JASRI）

• Hasegawa Yukio

  東京大学物性研究所

Bibliographic Information

Other Title

• 放射光励起走査トンネル顕微鏡による高分解能元素分析
• ホウシャコウレイキソウサ トンネル ケンビキョウ ニ ヨル コウブンカイノウ ゲンソ ブンセキ

Abstract

Microscope having atomic resolution with chemical sensitivity is one of the ultimate microscopes for the material science. Scanning tunneling microscope (STM) assisted by the core-level excitation using synchrotron radiation (SR) may be a possible candidate of such an ultimate microscope. We have demonstrated that we can observe element specific images of surfaces in the spatial resolution of several tens of nanometer by detecting the secondary electrons produced by the electron-hole recombination after the core-level excitation with an STM tip and taking the photon-induced current images. Recently, we have modified the system in order not only to improve its performance but also to accommodate a focused beam of a newly renovated beamline. Here, we briefly report on the modification and future prospects of this method.

Journal

• KENBIKYO

  KENBIKYO 47 (1), 14-17, 2012-03-30

  The Japanese Society of Microscopy

Keywords

• scanning tunneling microscope
• synchrotron radiation light
• elemental analysis
• X-ray absorption spectrum

Details

• CRID: 1390846609783223168
• NII Article ID: 10030552165
• NII Book ID: AA11917781
• DOI: 10.11410/kenbikyo.47.1_14
• ISSN: 24342386
• ISSN: 13490958
• NDL BIB ID: 023682555
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I023682555
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed