Current Controlled MOS Current Mode Logic with Auto-Detection of Threshold Voltage Fluctuation

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著者

    • NA Hyoungjun
    • Center for Interdisciplinary Research, Tohoku University
    • ENDOH Tetsuo
    • Center for Interdisciplinary Research, Tohoku University

抄録

In this paper, a theoretical analysis of current-controlled (CC-) MOS current mode logic (MCML) is reported. Furthermore, the circuit performance of the CC-MCML with the auto-detection of threshold voltage (<i>V<sub>th</sub></i>) fluctuation is evaluated. The proposed CC-MCML with the auto-detection of <i>V<sub>th</sub></i> fluctuation automatically suppresses the degradation of circuit performance induced by the <i>V<sub>th</sub></i> fluctuations of the transistors automatically, by detecting these fluctuations. When a <i>V<sub>th</sub></i> fluctuation of ±0.1V occurs on the circuit, the cutoff frequency of the circuit is increased from 0Hz to 3.5GHz by using the proposed CC-MCML with the auto-detection of <i>V<sub>th</sub></i> fluctuation.

収録刊行物

  • IEICE transactions on electronics

    IEICE transactions on electronics 95(4), 617-626, 2012-04-01

    一般社団法人 電子情報通信学会

参考文献:  8件中 1-8件 を表示

各種コード

  • NII論文ID(NAID)
    10030940868
  • NII書誌ID(NCID)
    AA10826283
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    09168524
  • データ提供元
    CJP書誌  J-STAGE 
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