All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator

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著者

    • IIZUKA Tetsuya
    • the Department of Electrical Engineering and Information Systems, The University of Tokyo
    • ASADA Kunihiro
    • the Department of Electrical Engineering and Information Systems, The University of Tokyo

抄録

This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring oscillator. The proposed circuit monitors the PMOS and NMOS process variabilities independently according to a count number of a single pulse which propagates on the ring during the buffer ring mode, and an oscillation period during the ring oscillator mode. Using this shared-ring structure, we reduce the occupation area about 40% without loss of process variability monitoring properties compared with the conventional circuit. The proposed shared-ring circuit has been fabricated in 65nm CMOS process and the measurement results with two different wafer lots show the feasibility of the proposed process variability monitoring scheme.

収録刊行物

  • IEICE transactions on electronics

    IEICE transactions on electronics 95(4), 627-634, 2012-04-01

    一般社団法人 電子情報通信学会

参考文献:  8件中 1-8件 を表示

各種コード

  • NII論文ID(NAID)
    10030940877
  • NII書誌ID(NCID)
    AA10826283
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    09168524
  • データ提供元
    CJP書誌  J-STAGE 
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