An all-digital on-chip process-control monitor for process-variability measurements

• KLASS F.

収録刊行物

• IEEE International Solid-State Circuits Conference Digest of Technical Papers, Feb. 2008

  IEEE International Solid-State Circuits Conference Digest of Technical Papers, Feb. 2008 408-409, 2008

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• CRID: 1573387450582499456
• NII論文ID: 10030940882
• データソース種別:
  • CiNii Articles