An all-digital on-chip PMOS and NMOS process variability monitor utilizing shared buffer ring and ring oscillator

• IIZUKA T.

Journal

• Proc. IEEE International Symposium on Design Diagnostics of Electronic Circuits and Systems, April 2011

  Proc. IEEE International Symposium on Design Diagnostics of Electronic Circuits and Systems, April 2011 115-120, 2011

Details

• CRID: 1573668925559214464
• NII Article ID: 10030940885
• Data Source:
  • CiNii Articles