Run-time active leakage reduction by power gating and reverse body biasing : An energy view

• XU H.

収録刊行物

• IEEE ICCD, 2008

  IEEE ICCD, 2008 618-625, 2008

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• CRID: 1570291225838311296
• NII論文ID: 10030940905
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  • CiNii Articles