Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering

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著者

    • OHTA Akio
    • Graduate School of Advanced Sciences of Matter, Hiroshima University
    • GOTO Yuta
    • Graduate School of Advanced Sciences of Matter, Hiroshima University
    • WEI Guobin
    • Graduate School of Advanced Sciences of Matter, Hiroshima University
    • MURAKAMI Hideki
    • Graduate School of Advanced Sciences of Matter, Hiroshima University

収録刊行物

  • IEICE transactions on electronics

    IEICE transactions on electronics 95(5), 879-884, 2012-05-01

参考文献:  21件中 1-21件 を表示

被引用文献:  2件中 1-2件 を表示

各種コード

  • NII論文ID(NAID)
    10030941470
  • NII書誌ID(NCID)
    AA10826283
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    09168524
  • データ提供元
    CJP書誌  CJP引用 
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