Study of fast initial charge loss and it's impact on the programmed states Vt distribution of charge-trapping NAND flash

• CHEN C. P.

収録刊行物

• IEDM Tech. Dig., 2010

  IEDM Tech. Dig., 2010 118-121, 2010

詳細情報

• CRID: 1571980075698681216
• NII論文ID: 10030941526
• データソース種別:
  • CiNii Articles