The 3-dimensional vertical FG NAND flash memory cell arrays with the novel electrical S/D technique using the extended sidewall control gate (ESCG)

• SEO M. S.

収録刊行物

• International Memory Workshop 2010. Dig.

  International Memory Workshop 2010. Dig. 146-149, 2010

詳細情報

• CRID: 1570009750861706880
• NII論文ID: 10030941528
• データソース種別:
  • CiNii Articles