Evaluation of L-2L De-Embedding Method Considering Misalignment of Contact Position for Millimeter-Wave CMOS Circuit Design

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著者

    • BU Qinghong
    • Department of Physical Electronics, Tokyo Institute of Technology
    • LI Ning
    • Department of Physical Electronics, Tokyo Institute of Technology
    • OKADA Kenichi
    • Department of Physical Electronics, Tokyo Institute of Technology

収録刊行物

  • IEICE transactions on electronics

    IEICE transactions on electronics 95(5), 942-948, 2012-05-01

参考文献:  18件中 1-18件 を表示

各種コード

  • NII論文ID(NAID)
    10030941653
  • NII書誌ID(NCID)
    AA10826283
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    09168524
  • データ提供元
    CJP書誌 
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