Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool

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In this paper, we propose a test generation method for diagnosing transition faults. The proposed method assumes launch on capture test, and it generates test vectors for given fault pairs using a stuck-at ATPG tool so that they can be distinguished. If a given fault pair is indistinguishable, it is identified, and thus the proposed method achieves a complete diagnostic test generation. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic gates are inserted in a CUT during the test generation process. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify indistinguishable fault pairs.

収録刊行物

  • IEICE transactions on information and systems

    IEICE transactions on information and systems 95(4), 1093-1100, 2012-04-01

    一般社団法人 電子情報通信学会

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各種コード

  • NII論文ID(NAID)
    10030942163
  • NII書誌ID(NCID)
    AA10826272
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    09168532
  • データ提供元
    CJP書誌  J-STAGE 
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