Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool

• HIGAMI Yoshinobu

  Graduate School of Science and Engineering, Ehime University

• OHNO Satoshi

  Graduate School of Science and Engineering, Ehime University

• YAMAOKA Hironori

  Graduate School of Science and Engineering, Ehime University

• TAKAHASHI Hiroshi

  Graduate School of Science and Engineering, Ehime University

• SHIMIZU Yoshihiro

  STARC (Semiconductor Technology Academic Research Center)

• AIKYO Takashi

  STARC (Semiconductor Technology Academic Research Center)

Abstract

In this paper, we propose a test generation method for diagnosing transition faults. The proposed method assumes launch on capture test, and it generates test vectors for given fault pairs using a stuck-at ATPG tool so that they can be distinguished. If a given fault pair is indistinguishable, it is identified, and thus the proposed method achieves a complete diagnostic test generation. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic gates are inserted in a CUT during the test generation process. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify indistinguishable fault pairs.

Journal

• IEICE Transactions on Information and Systems

  IEICE Transactions on Information and Systems E95.D (4), 1093-1100, 2012

  The Institute of Electronics, Information and Communication Engineers

Keywords

• fault diagnosis
• test generation
• transition faults
• stuck-at ATPG

Details

• CRID: 1390001204377422336
• NII Article ID: 10030942163
• NII Book ID: AA10826272
• DOI: 10.1587/transinf.e95.d.1093
• BIBCODE: 2012IEITI..95.1093H
• ISSN: 17451361
• ISSN: 09168532
• Web Site: https://www.jstage.jst.go.jp/article/transinf/E95.D/4/E95.D_4_1093/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed