Concurrent execution of diagnostic fault simulation and equivalence identification during diagnostic test generation

• YU X.

収録刊行物

• Proc. VLSI Test Symp., 2003

  Proc. VLSI Test Symp., 2003 351-356, 2003

詳細情報

• CRID: 1570854175792245248
• NII論文ID: 10030942171
• データソース種別:
  • CiNii Articles