Coherent X-Ray Diffraction Imaging of Non-Crystalline Particles

  • NAKASAKO Masayoshi
    Department of physics, Faculty of Science and Technology, Keio University RIKEN SPring-8 Center, RIKEN Harima Institute
  • TAKAYAMA Yuki
    Department of physics, Faculty of Science and Technology, Keio University RIKEN SPring-8 Center, RIKEN Harima Institute
  • OROGUCHI Tomotaka
    Department of physics, Faculty of Science and Technology, Keio University RIKEN SPring-8 Center, RIKEN Harima Institute
  • SHIRAHAMA Keiya
    Department of physics, Faculty of Science and Technology, Keio University
  • SEKIGUCHI Yuki
    Department of physics, Faculty of Science and Technology, Keio University RIKEN SPring-8 Center, RIKEN Harima Institute
  • YAMAMOTO Masaki
    RIKEN SPring-8 Center, RIKEN Harima Institute
  • YONEKURA Koji
    RIKEN SPring-8 Center, RIKEN Harima Institute
  • HIKIMA Takaaki
    RIKEN SPring-8 Center, RIKEN Harima Institute
  • MAKI Saori
    RIKEN SPring-8 Center, RIKEN Harima Institute
  • TAKAHASHI Yukio
    RIKEN SPring-8 Center, RIKEN Harima Institute Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
  • SUZUKI Akihiro
    RIKEN SPring-8 Center, RIKEN Harima Institute Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
  • MATSUNAGA Sachihiro
    Department of Applied Biological Science, Faculty of Science and Technology, Tokyo University of Science
  • KATO Shoichi
    Department of Applied Biological Science, Faculty of Science and Technology, Tokyo University of Science
  • HOSHI Takahiko
    Kohzu Precision Co., Ltd.

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Other Title
  • 非結晶粒子のコヒーレントX線回折イメージング
  • Laser Review 非結晶粒子のコヒーレントX線回折イメージング
  • Laser Review ヒケッショウ リュウシ ノ コヒーレント Xセン カイセツ イメージング

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Abstract

Coherent X-ray diffraction imaging (CXDI) is a lens-less imaging technique that visualizes the structures of non-crystalline particles with micro- to sub-micrometer dimensions. In CXDI experiments, single spatially isolated particles are irradiated by X-ray beam with high transverse coherence. The projection images of the particles along the incident X-ray direction are then directly reconstructed from the diffraction amplitude using a phase retrieval algorithm. We recently developed a sample preparation system operated under a moisture controlled condition and a diffractometer to conduct cryogenic CXDI experiments at SPring-8 and the X-ray free electron laser (XFEL) facility called SACLA. Here we briefl y introduce the theoretical background and show the preliminary experimental data from samples prepared by the humidity-control system collected with the diffractometer at BL29XU of SPring-8 and the BL3 of SACLA.

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