Statistical comparison of random telegraph noise (RTN) in bulk and fully depleted SOI MOSFETs
収録刊行物
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- Digest of 12th International Conference on Ultimate Integration on Silicon (ULIS), Cork, Ireland, 14-16 March 2011
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Digest of 12th International Conference on Ultimate Integration on Silicon (ULIS), Cork, Ireland, 14-16 March 2011 2011