Characterization of Low-Frequency Noise in GaAs Nanowire Field-Effect Transistors Controlled by Schottky Wrap Gate

• MIURA K.

収録刊行物

• Jpn. J. Appl. Phys.

  Jpn. J. Appl. Phys. 50 06GF18-, 2011

詳細情報

• CRID: 1570854176181771008
• NII論文ID: 10031112859
• データソース種別:
  • CiNii Articles