Application of Signal Processing and Statistical Processing to Electron Microscopic Datasets

• Muto Shunsuke

  名古屋大学大学院・工学研究科

Bibliographic Information

Other Title

• 各種信号処理・統計的手法の電子顕微鏡データへの応用
• 学会賞(瀬藤賞)受賞論文 各種信号処理・統計的手法の電子顕微鏡データへの応用
• ガッカイショウ セトウショウ ジュショウ ロンブン カクシュ シンゴウ ショリ トウケイテキ シュホウ ノ デンシ ケンビキョウ データ エ ノ オウヨウ

Abstract

Recent trends have pushed the scientific instruments associated with electron microscopy toward computer-controlled and automatic operation. It could be very effective under such circumstances to apply mathematical treatments suitable for the microscopic and spectroscopic data characteristics and extract information embedded thereby as much as possible, particularly for noise reduction, resolution improvement and statistical information extraction. In the present article several signal and image processing techniques, their features and application examples, which have been done by the present author are introduced.

Journal

• KENBIKYO

  KENBIKYO 46 (1), 24-29, 2011-03-30

  The Japanese Society of Microscopy

Keywords

• wavelet
• PIXON method
• multivariate analysis
• electron energy-loss spectroscopy
• spectrum image

Details

• CRID: 1390846609785967488
• NII Article ID: 10031144724
• NII Book ID: AA11917781
• DOI: 10.11410/kenbikyo.46.1_24
• ISSN: 24342386
• ISSN: 13490958
• HANDLE: 2237/21127
• NDL BIB ID: 11083616
• Web Site: https://nagoya.repo.nii.ac.jp/records/19039
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I11083616
• Text Lang: ja
• Data Source:
  • JaLC
  • IRDB
  • NDL
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed