Recent progress in evaluation techniques for organic thin films and interfaces

• ISHII Hisao

  Center for Frontier Science, Chiba University

Bibliographic Information

Other Title

• 有機薄膜界面の評価技術の進展
• ユウキ ハクマク カイメン ノ ヒョウカ ギジュツ ノ シンテン

Abstract

With the rapid growth of organic electronics, various techniques to evaluate material properties and device characteristics have been developed. Among these methods, this article reports on those that examine electronic structures such as photoemission spectroscopy and those that explore carrier behaviors in devices. A brief perspective will be also provided.

Journal

• Oyo Buturi

  Oyo Buturi 82 (6), 497-500, 2013-06-10

  The Japan Society of Applied Physics

Keywords

• photoemission spectroscopy
• photoelectron yield spectroscopy
• gap states
• electronic structure
• carrier behavior
• displacement current measurement
• interface
• organic semiconductor
• organic electronics

Details

• CRID: 1390001277360733440
• NII Article ID: 10031174392
• NII Book ID: AN00026679
• DOI: 10.11470/oubutsu.82.6_497
• ISSN: 21882290
• ISSN: 03698009
• NDL BIB ID: 024632011
• Web Site: http://id.ndl.go.jp/bib/024632011
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I024632011
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed