Two-Tone Signal Generation for ADC Testing

DOI Web Site 3 Citations 23 References
  • KATO Keisuke
    Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
  • ABE Fumitaka
    Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
  • WAKABAYASHI Kazuyuki
    Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
  • GAO Chuan
    Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
  • YAMADA Takafumi
    Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
  • KOBAYASHI Haruo
    Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
  • KOBAYASHI Osamu
    Semiconductor Technology Academic Research Center (STARC)
  • NIITSU Kiichi
    Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University

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Abstract

This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.

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