Strain and Size Analyses from X-ray Line Broadening of Pulverized Quartz

• Nagao, Hiroyuki

• Aikawa, Nobuyuki

抄録

Described is an original procedure analysing a breadth of a broadened X-ray line profile by a pattern fitting technique to evaluate microstrain and crystallite size of pulverized quartz. This procedure is enough satisfactory for either a mean crystallite size of less than 200 nm or mean microstrain of greater than 2×10^-4....

収録刊行物

• Journal of geosciences Osaka City University

  Journal of geosciences Osaka City University 28 105-123, 1985-03

  Faculty of Science, Osaka City University

詳細情報

• CRID: 1050282677422720512
• NII論文ID: 110000003491
• NII書誌ID: AA00252439
• ISSN: 04492560
• Web Site: https://dlisv03.media.osaka-cu.ac.jp/il/meta_pub/G0000438repository_KJ00000003797
• 本文言語コード: en
• 資料種別: departmental bulletin paper
• データソース種別:
  • IRDB
  • CiNii Articles