結晶格子を基準とする微小長さ測定　（第３報）　　熱ドリフト誤差の抑制と測定範囲の数μｍレベルへの拡大

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書誌事項

タイトル別名
  • Small Length Measurement Using Regular Crystalline Lattice for Reference. (3rd Report). Suppression of Thermal Drift Error and Extension of Measurement Range to Micrometers.
  • ケッショウ コウシ オ キジュン ト スル ビショウ ナガサ ソクテイ ダイ3ポウ ネツ ドリフト ゴサ ノ ヨクセイ ト ソクテイ
  • Suppression of Thermal Drift Error and Extension of Measurement Range to Micrometers
  • 熱ドリフト誤差の抑制と測定範囲の数μmレベルへの拡大

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This paper describes a suppression of the thermal drift error and an extension of a measurement range to micrometers in the comparative length measurement using a regular crystalline lattice as a reference scale and a dual tunneling unit scanning microscope (DTU-STM) as a detector. A thermo-stabilized cell, in which the DTU-STM can be set, was developed to reduce the temperature fluctuation to less than 0.05K. In order to assess the thermo-stabilized cell, direct length comparison between the certified scanning electron microscope (SEM) standard grating with a average pitch of 240 nm and highly oriented pyrolytic graphite (HOPG) lattice spacing, which is 0.246nm, was performed using the DTU-STM, whose main body is made from Super-Invar. Images of the grating and the HOPG were simultaneously obtained in the range of 1 μm. To shorten the measurement time and thus reduce the thermal drift error, the lengths of 1μm for the two samples were measured along the fast scanning axis. A new ultra-low thermally drifted DTU-STM, whose body is fabricated from ultra-low linear expansion glass, was also developed to extend a measurement range to micrometers in the comparative length measurement. Long atomic image of HOPG crystal over a 5-μm-long region along the fast scanning axis was obtained using the new DTU-STM in the thermo-stabilized cell. The experimental results show the possibility of the comparative length measurement in micrometers range with sub-nanometer resolution using the HOPG crystal and the DTU-STMs.

収録刊行物

  • 精密工学会誌

    精密工学会誌 65 (1), 121-125, 1999

    公益社団法人 精密工学会

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