Low-Temperature Phase Transitions in Rb3H1-xDx(XO4)2(X:S,Se)

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Author(s)

    • Gesi Kazuo GESI K.
    • Department of Materials Science,College of Science and Engineering,Iwaki Meisei University

Abstract

Low-temperature phase transitions in the solid solutions Rb,H. .0..(SO.). andRb.I-I. .0..(Se0.), have been studied by dielectric measurements. The phase transi-Lions, which do not exist in the hydrogen compounds (,v=0), appear at deuterium con-tents above the critical contents, x.,?.. The observed critical contents are about 0.22and 0.04 for Rb.H, .0..(SO.), and Rb,H, .0..(Se0.)., respectively. The relationT.cx- (x - "crate"' between the transition temperature T. and x holds over a wide rangeof x for Rb,H. ,D.(SeO.)., but in a rather limited range for Rb,H. ..0.(SO.)..Rb.H,-..0.(SO.)., Rb3H, .D.(SeO.)., phase transition, dielectric

Journal

  • Journal of the Physical Society of Japan

    Journal of the Physical Society of Japan 61(1), p162-167, 1992-01

    The Physical Society of Japan (JPS)

Cited by:  1

Codes

  • NII Article ID (NAID)
    110001969374
  • NII NACSIS-CAT ID (NCID)
    AA00704814
  • Text Lang
    ENG
  • Article Type
    Journal Article
  • ISSN
    00319015
  • NDL Article ID
    3753430
  • NDL Source Classification
    MC62(分子・物性--結晶)
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z53-A404
  • Data Source
    CJPref  NDL  NII-ELS 
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