Effective on-site Repulsion in Molecular Conductors with Dimeric Structure: Is the Transfer Integral a Good Measure of Correlation?

• Tamura Masafumi

  Condensed Molecular Materials Lab., RIKEN

• Kato Reizo

  Condensed Molecular Materials Lab., RIKEN

抄録

The effective repulsive energy between the carriers in a molecular dimer has been examined in terms of the extended Hubbard model. The intermolecular Coulomb repulsion, V, rather than the intradimer transfer integral, t, has been shown to give major contribution to the effective repulsion in a strongly dimerized case. The effective repulsion of the dimer, as well as t, increases upon dimerization, for this reason. This analysis has been applied also to a two-level system, so that the strength of correlation is related to the structural features.

収録刊行物

• Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｐｈｙｓｉｃａｌ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ

  Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｐｈｙｓｉｃａｌ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ 73 (11), 3108-3110, 2004

  一般社団法人 日本物理学会

キーワード

• organic conductors
• strong correlation
• dimer
• on-site repulsion
• extended Hubbard model

詳細情報

• CRID: 1390001204186254336
• NII論文ID: 110001979264
• NII論文ID: 130004538657
• NII論文ID: 210000105155
• NII書誌ID: AA00704814
• DOI: 10.1143/jpsj.73.3108
• BIBCODE: 2004JPSJ...73.3108T
• COI: 1:CAS:528:DC%2BD2MXnslamsw%3D%3D
• ISSN: 13474073
• ISSN: 00319015
• NDL書誌ID: 7157055
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7157055
• Web Site: https://journals.jps.jp/doi/pdf/10.1143/JPSJ.73.3108
• 本文言語コード: en
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可