Pressure-induced Change in Temperature Coefficient of Electrical Resistivity in CeCuAs2

• Abliz Melike

  Institute for Solid State Physics, University of Tokyo

• Nakano Tomohito

  Institute for Solid State Physics, University of Tokyo

• Sampathkumaran Echur Varadadesikan

  Tata Institute of Fundamental Research

• Jemetio Jean Paul Feudjio

  Institut für Anorganische Chemie, Technische Universität Dresden

• Doert Thomas

  Institut für Anorganische Chemie, Technische Universität Dresden

• Hedo Masato

  Institute for Solid State Physics, University of Tokyo

• Uwatoko Yoshiya

  Institute for Solid State Physics, University of Tokyo

Bibliographic Information

Other Title

• Pressure-induced Change in Temperature Coefficient of Electrical Resistivity in CeCuAs₂

Abstract

The intermetallic compound, CeCuAs₂, crystallizing in a HfCuSi₂-type tetragonal structure, has recently been shown to exhibit a negative temperature (T) coefficient of electrical resistivity (ρ) in the entire T-range of investigation (45 mK to 300 K). Here, we report that an application of external pressure (up to 10 GPa) profoundly influences ρ(T) behavior, reversing the sign of dρ⁄dT at pressures above 8 GPa, presumably arising from increasing 4f hybridization or changes in pseudo-gap. Such a behavior is uncommon among Ce-based intermetallic compounds.

Journal

• Journal of the Physical Society of Japan

  Journal of the Physical Society of Japan 74 (2), 508-510, 2005

  THE PHYSICAL SOCIETY OF JAPAN

Keywords

• phase transition
• CeCuAs<SUB>2</SUB>
• resistivity
• high pressure

Details

• CRID: 1390001204188397440
• NII Article ID: 210000105840
• NII Article ID: 110001979402
• NII Article ID: 130004539115
• NII Book ID: AA00704814
• DOI: 10.1143/jpsj.74.508
• BIBCODE: 2005JPSJ...74..508A
• ISSN: 13474073
• ISSN: 00319015
• NDL BIB ID: 7250987
• Web Site: http://id.ndl.go.jp/bib/7250987
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7250987
• Web Site: http://journals.jps.jp/doi/pdf/10.1143/JPSJ.74.508
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed